SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth USD 7661 Million and is forecast to reach approximately USD 14430 Million by 2031 with a CAGR of 9.6% during ...