Anyone involved in IC product sign-off that includes a mixed signal design portion knows that developing robust tests for these intricate designs has historically been a significant bottleneck, no ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...