A device may pass a static test with flying colors, but when put into a real-life situation it may still fail and break, and that's bad for anyone standing underneath. Why is dynamic drop testing ...

One of the more interesting detailed conversations at DAC this year was with Teklatech, a small Danish company supplying a tool to improve dynamic IR drop and clock noise problems. Unlike analysis ...

As VLSI technology scales to 90 nanometers and beyond, ASIC vendors increasingly see power grid integrity issues in their designs and in the field, for two primary reasons. First, deep-submicron ...