The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Assume that we have a sequence of n independent and identically distributed random variables with a continuous distribution function F, which is specified up to a few unknown parameters. In this paper ...

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...

Parametric features are becoming more common in FEA packages. The key benefit of parametric features is that they let users see the effects of design changes quickly. With adequate planning, users can ...

March 30, 2012. Keithley Instruments Inc. has enhanced the capabilities of its S530 parametric test systems for high-speed production parametric test. Supported by the latest version of Keithley Test ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...