Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...
Today's chip designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries, and gate counts are pushing towards the 100M gate mark. Semiconductor companies creating these ...
Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Today, PCBs are becoming more and more complex, and that means adequate test coverage is becoming harder and harder to achieve. Moreover, every test methodology has its limitations. As a result, many ...
Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...
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