Available with up to 48 pins and eight source-measurement units, the next-generation 4080 Series parametric test platform from Agilent Technologies features resolution to 1 femtoamp and 0.1 microvolt.
SANTA CLARA, Calif.—Agilent Technologies Inc. introduces its next-generation parametric test platform, which is designed to meet the evaluation needs of engineers working in semiconductor fabs and ...
Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...
SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
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