A mathematical model that uses microwave spectroscopic methods to interpret EtO measurements may provide a powerful software tool for process engineers. by Zhangwu Zhu and Ian P. Matthews Figure 1.
Dynamic optimisation and model predictive control (MPC) are at the forefront of modern process systems engineering, offering robust methodologies to address the challenges posed by time-varying ...
Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
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