A research team of fusion scientists has succeeded in developing "the nano-scale sculpture technique" to fabricate an ultra-thin film by sharpening a tungsten sample with a focused ion beam. This ...

JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM ...

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...

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ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. · GlobeNewswire Inc.

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When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

These two common methods are used to prepare electron transport specimens for a range of materials including metals, semiconductors and ceramics. FIB is feasible in cases when there is a need for ...